In a study last year of damage control on a circuit card within an electronic assembly during HASS, damage variations for position and time could exceed 1000:1. Understanding the control on damage for you chamber(s) and test item is very important in any decision on results from HASS (as well as HALT).
The article with the above results is:
"A Look Under the Hood of HALT and HASS"
(Although HALT and HASS methodologies have become widely accepted in military programs, not enough attention is paid to what is actually happening to hardware in those test environments)
By Starr, Walker
COTS Journal, January 2008
A link to the article can be found on:
http://www.cirvibe.com/cirvibe_articles.html
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